Product Description

Jointed test probe for equipment not likely to be accessible to children

Reference Standard:

IEC62368-1-Figure V.2

Specification:

Knurled Finger Diameter:12mm
Knurled Finger Length:80mm
Baffle Plate Diameter:50mm
Baffle Plate Length:100mm
Baffle Thickness:20mm

Tolerances on dimensions without specific tolerances:
– 14° and 37° angles: ± 15 ′
– on radii: ± 0,1 mm
– on linear dimensions:
≤ 15 mm:  0 ,-0.1 mm
> 15 mm ≤ 25 mm: ± 0,1 mm
> 25 mm: ± 0,3 mm
NOTE This jointed test probe is taken from Figure 2, test probe B of IEC 61032:1997.